Ключевые слова: chalcogenide, pnictides, wires, tapes, grain boundaries, films epitaxial
Puig T., Palau A., Obradors X., Larbalestier D., Jaroszynski J., Abraimov D., Valles F., Mundet B., Constantinescu A.
Strbik V., Chromik S., Spankova M., Rosova A., Camerlingo C., Sojkova M., Talacko M., Bareli G., Jung G.
Ключевые слова: HTS, YBCO, thin films, films epitaxial, substrate single crystal, comparison, PLD process, irradiation effects, electron irradiation, defects, Raman spectroscopy, resistive transition, critical caracteristics, critical current, temperature dependence, oxygen, composition, electron diffraction, microstructure
Ключевые слова: HTS, YBCO, films epitaxial, fabrication, substrate LaAlO3, powder processing, precipitation methods, optical imaging, microstructure, X-ray diffraction
Puig T., Obradors X., Ricart S., Mocuta C., Pino F., Banchewski J., Queraltу A., Pacheco A., Gupta K., Saltarelli L., Garcia D., Alcalde N.
Ключевые слова: HTS, EuBCO, doping, PLD process, IBAD process, coated conductors, films epitaxial, fabrication, X-ray diffraction, microstructure, critical caracteristics, Jc/B curves, anisotropy, pinning
Antonov A.V., Ikonnikov A.V., Masterov D.V., Mikhaylov A.N., Morozov S.V., N.Nozdrin Y., Pavlov S.A., Parafin A.E., Tetel’baum D.I., Ustavschikov S.S., Vasiliev V.K., Yunin P.A., Savinov D.A.
Varela M., Arenholz E., Liu K., Takamura Y., Murray P.D., Gilbert D.A., Grutter A.J., Kirby B.J., Hernandez-Maldonado D., Brubaker Z.E., Liyanage W.L., Chopdekar R.V., Taufour V., Zieve R.J., Jeffries J.R., Borchers J.A.
Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Meledin A., Pinto V., Feighan J., Mayer J.
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, nanodoping, nanoscaled effects, PLD process, pinning centers artificial, microstructure, X-ray diffraction, lattice parameter, critical temperature, critical caracteristics, Jc/B curves, growth rate, pinning force, temperature dependence, critical current density, angular dependence, fabrication, experimental results
Lang W., Pedarnig J.D., Dosmailov M., Koelle D., Kleiner R., Mletschnig K.L., Aichner B., Muller B., Karrer M.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate single crystal, films epitaxial, irradiation effects, ion irradiation, vortex structures, pinning centers artificial, defects columnar, flux flow resistance, magnetic field dependence, angular dependence, experimental results, temperature distribution
Puig T., Obradors X., Ricart S., Guzman R., Soler L., Farjas J., Mocuta C., Chamorro N., Jareсo J., Banchewski J., Rasi S., Yanez R., Roura-Grabulosa P.
Galluzzi V., Mancini A., Puig T., Celentano G., Palau A., Obradors X., Bartolome E., Augieri A., Pompeo N., Silva E., Torokhtii K., Alimenti A.
Ключевые слова: HTS, YBCO, films epitaxial, PLD process, chemical solution deposition, substrate LaAlO3, nanoscaled effects, anisotropy, impedance, angular dependence, magnetic field dependence, measurement technique, defects, nanorods, twin boundaries, nanoparticles, pinning mechanism, flux flow resistance, comparison
Ключевые слова: HTS, YBCO, liquid phase epitaxy, fabrication, films epitaxial, substrate single crystal, saturation
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Wang Y., Christiani G., Keimer B., Minola M., Aken P.A., Putzky D., Radhakrishnan P., Wochner P., Logvenov G., Benckiser E.
Ключевые слова: HTS, DyBCO, films epitaxial, molecular beam epitaxy, mechanical effects, strain effects, microstructure, experimental results
Puig T., Obradors X., Ricart S., Guzman R., Soler L., Farjas J., Mocuta C., Banchewski J., Rasi S., Roura-Grabulosa P., Jareno J., Kreuzer M.
Ключевые слова: HTS, YBCO, grain boundaries, grain structure, doping effect, substitution, films epitaxial, PLD process, substrate SrTiO3, grain structure, critical caracteristics, Jc/B curves, n-value, composition, X-ray diffraction, oxygenation treatments, flux flow resistance, experimental results
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